Reprints of papers #21-40 are available. Send me an e-mail (wipf@ra.msstate.edu) to request a copy. Please give your full address in your request!
Last Update April 21, 2005, wipf@ra.msstate.edu
[Refereed Publications] [Presentations] [Invited Publications]
[Patents] [Student and Collaborator Presentations] [Theses and Dissertations]
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*39. “Voltammetry
and Surface Analysis of AISI 316 Stainless Steel in Chloride-Containing Simulated Concrete
Pore Environment,” Lucien Veleva, Mario Alpuche-Aviles, and David O. Wipf, J. Electroanal. Chem, 2005, 578,
45-53.
*38. “Activity
of SiC Particles in Al-Based Metal Matrix Composites Revealed by SECM,” L.
Díaz-Ballote, David O. Wipf, L. Veleva, M. A. Pech-Canul, M. I. Pech-Canul, J.
Electrochem. Soc., 2004, 151, B299-B303.
37.
“Scanning Electrochemical Microscopy of Model Neurons:
Imaging and Real-Time Detection of Morphological Changes,” Johanna M. Liebetrau,
Heather M. Miller, John E. Baur, Sara A.Takacs, Rick Crous, Vipave Anupunpisit, Paul A.
Garris, David O. Wipf, Analytical Chemistry, 2003, 75,
563-571.
*36. “Patterning and Imaging of Oxides on Glassy
Carbon Electrode Surfaces by Scanning Electrochemical Microscopy,” Robert C. Tenent
and David O. Wipf, J. Electrochem. Soc., 2003, 150, E131-E139.
*35. “An in situ Electrochemical Study of
Electrodeposited Nickel and Nickel-Yttrium Oxide Composite Using Scanning Electrochemical
Microscopy,” L. Veleva, L. Diaz-Ballote and David O. Wipf, J. Electrochem. Soc.,
2003, 150, C1-C6.
*34. “Comparative
Cyclic Voltammetry and Surface Analysis of Passive Films Grown on 316 Stainless Steel in
Concrete Pore Model Solutions,” Mario Alpuche-Aviles, L. Veleva, and David O. Wipf, J.
Electroanal. Chem., 2002, 537, 85-93.
*33. “Impedance Feedback Control for Scanning Electrochemical Microscopy,” Mario A. Alpuche-Aviles and David O. Wipf, Anal. Chem., 2001, 73, 4873-4881.
*32. “Conductivity Detection for Monitoring Mixing Reactions in Microfluidic Devices,” Yan Liu, David O. Wipf and Charles S. Henry Analyst, 2001, 126, 1248-1251.
*31. “Fabricating and Imaging Carbon-Fiber Immobilized Enzyme Ultramicroelectrodes with Scanning Electrochemical Microscopy,” , Robert C. Tenent and David O. Wipf, Anal. Sci. 2001, 17, 27-35.
*30. “UV/Ozone Pretreatment of Glassy Carbon Electrodes,” Junfeng Zhou and David O. Wipf, J. Electroanal. Chem., 2001, 499, 121-128.
*29. “Microscopic
Measurement of pH with Iridium Oxide Microelectrodes,” David O. Wipf, Fuyun Ge,
Thomas W. Spaine, John E. Baur, Anal. Chem., 2000, 72,
4921-4927.
*28. “Crystallographic and Stereoscopic Characterization of Tetrakis(m-N,N-diarylformamidinato)dichlorodirhenium(III,III) Compounds,” Judith L. Eglin, Chun Lin, Tong Ren, Laura Smith, Richard J. Staples, and David O. Wipf, Euro. J. of Inorg. Chem. 1999, 2095-2013.
*27. “Synthesis of Multiply-Bonded Dichromium Complexes with a Variety of Formamidinate Ligands,” Kathryn M. Carlson-Day, Judith L. Eglin, Chun Lin, Laura T. Smith, Richard J. Staples, and David O. Wipf, Polyhedron, 1999, 18, 817-824.
26. “Selective Determination of Methylmercury by Flow-Injection Fast-Scan Voltammetry,” Rebecca Lai, Eva L Huang, Feimeng Zhou, and David O. Wipf, Electroanalysis., 1998, 10, 926-930.
*25. “Localized Avidin/Biotin Derivatization of Glassy Carbon Electrodes Using Scanning Electrochemical Microscopy”, Wilbur B. Nowall, David O. Wipf, and Werner G. Kuhr, Anal. Chem., 1998, 70, 2601-2606.
*24. “Breakdown of the Iron Passive Layer by use of the Scanning Electrochemical Microscope,” John W. Still and David O. Wipf J. Electrochem. Soc., 1997, 144, 2657-2665.
*23. “Construction of Gold Micro-Bead Electrodes,” Deon T. Miles+, Andrew Knedlik+, and David O. Wipf Anal. Chem., 1997, 69, 1240-1243.
*22. “Deposition of Conducting Polyaniline Patterns with the Scanning Electrochemical Microscope,” Junfeng Zhou and David O. Wipf J. Electrochem. Soc., 1997, 144, 1202-1207.
*21. “Ohmic Drop Compensation in Voltammetry: Iterative Correction of the Applied Potential,” David O. Wipf Anal. Chem., 1996, 68, 1871-1876.
*20. “Initiation and Study of Localized
Corrosion by Scanning Electrochemical Microscopy,” David O. Wipf Colloids and Surfaces A, 1994, 93,
251-261.
19. “Scanning Electrochemical
Microscopy. 21.
Constant-Current Imaging,” David O. Wipf, Allen J. Bard, and Dennis E.
Tallman Anal. Chem., 1993,
65, 1373-1377.
18. “Scanning Electrochemical Microscopy. 15. Improvements in Imaging via Tip-Position Modulation and Lock-In Detection,” David O. Wipf and Allen J. Bard Anal. Chem., 1992, 64, 1362-1367.
17. “Chemical Imaging of Surfaces with the Scanning Electrochemical Microscope,” Allen J. Bard, Fu-Ren F. Fan, David T. Pierce, Patrick R. Unwin, David O. Wipf, and Feimeng Zhou Science, 1991, 254, 68-74.
16. “Scanning Electrochemical Microscopy. 12. Theory and Experiment of the Feedback Mode with Finite Heterogeneous Electron-Transfer Kinetics and Arbitrary Substrate Size,” Allen J. Bard, Michael V. Mirkin, Patrick R. Unwin, David O. Wipf J. Phys. Chem., 1992, 96, 1861-1868.
15. “The Application of Rapid Scan Cyclic Voltammetry to a Study of the Oxidation and Dimerization of N,N-Dimethylaniline in Acetonitrile,” Hongjun Yang, David O. Wipf, Allen J. Bard J. Electroanal. Chem., 1992, 331, 913-924.
14. “Scanning Electrochemical Microscopy. 11. Improvement of Image Resolution by Digital Processing Techniques,” Chongmok Lee, David O. Wipf, Allen J. Bard, Keith Bartels, and Alan C. Bovik Anal. Chem., 1991, 63, 2442-2447.
13. “Scanning Electrochemical Microscopy. 10. High Resolution Imaging of Active Sites on an Electrode Surface,” David O. Wipf and Allen J. Bard J. Electrochem. Soc., 1991, 138, L4-L6.
12. “Scanning Electrochemical Microscopy,” Allen J. Bard, Patrick R. Unwin, David O. Wipf, and Feimeng Zhou Am. Inst. Phys., Conf. Proc.- 241; K. Wickramasinge, Ed.; American Institute of Physics: New York, 1992; pp. 235-247.
11. “Scanning Electrochemical Microscopy. Part 7. Effect of Heterogeneous Electron-Transfer Rate at the Substrate on the Tip Feedback Current,” David O. Wipf and Allen J. Bard J. Electrochem. Soc., 1991, 138, 469-474.
10. “Scanning Electrochemical Microscopy: A New Technique for the Characterization and Modification of Surfaces,” Allen J. Bard, Guy Denuault, Chongmok Lee, Daniel Mandler, and David O. Wipf Acc. Chem. Res., 1990, 23, 357-363.
9. “High-Speed Cyclic Voltammetry,” R. Mark Wightman and David O. Wipf Acc. Chem. Res., 1990, 23, 64-70.
8. “Voltammetry Under Linear-Diffusion Conditions in Resistive Solvents,” David O. Wipf and R. Mark Wightman Anal. Chem., 1990, 62, 98-102.
7. “Microdisk Electrodes, II. Fast-Scan Cyclic Voltammetry with Very Small Electrodes,” David O. Wipf, Adrian C. Michael, and R. Mark Wightman J. Electroanal. Chem., 1989, 269, 15-25.
6. “Rapid Cleavage Reactions of Haloaromatic Radical Anions Measured with Fast-Scan Cyclic Voltammetry,” David O. Wipf and R. Mark Wightman J. Phys. Chem., 1989, 93, 4286-4291.
5. “Voltammetry at Ultramicroelectrodes,” R. Mark Wightman and David O. Wipf, Electroanalytical Chemistry, A. J. Bard, Ed.; Marcel Dekker: New York, 1989; Vol. 15.
4. “Submicrosecond Measurements with Cyclic Voltammetry,” David O. Wipf and R. Mark Wightman Anal. Chem., 1988, 60, 2460-2464.
3. “Fast-Scan Cyclic Voltammetry as a Method to Measure Rapid Heterogeneous Electron- Transfer Kinetics,” David O. Wipf, Eric W. Kristensen, Mark R. Deakin, and R. Mark Wightman Anal. Chem., 1988, 60, 306-310.
2. “Disproportionation of Quinone Radical Anions in Protic Solvents at High pH,” David O. Wipf, Kenneth R. Wehmeyer, and R. Mark Wightman J. Org. Chem., 1986, 51, 4760-4764.
1. “Ultramicroelectrodes,” R. Mark Wightman, Mark R. Deakin, David O. Wipf, and Paul Kovach Proceedings of the Workshop on Electrochemical Education, The Electrochemical Society, 1986.
Invited Publications4.
“Analytical and Digital
Instrumentation,” David O. Wipf in The Encyclopedia of Electrochemistry, Vol 3:
Instrumentation and Electroanalytical Chemistry, A. J. Bard, M. Stratmann, and G. S.
Wilson, Eds, Vch Verlagsgesellschaft Mbh, Weinheim, 2003.
3.
“Scanning
Electrochemical Microscopy,” David O. Wipf in The
Encyclopedia of Imaging Science and Technology, J. P. Hornak, Ed, John Wiley & Sons, Inc., New York, 2002, pp 1248-1259.
2.
“Instrumentation,”
David O. Wipf in Scanning Electrochemical
Microscopy, A. J. Bard and M. V. Mirkin, Eds, Marcel Dekker, New York, 2001, pp. 17-74.
1. “Scanning
Electrochemical Microscopy,” David O. Wipf in Current
Protocols: Methods in Materials Research, E.N. Kaufmann et al., Eds, John Wiley &
Sons, Inc, New York, 2000. 7c.2.1-7c.2.18.
U. S. Patent #5382336 "Tip Position Modulation and Lock-in Detection in Scanning Electrochemical Microscopy", David O. Wipf and Allen J. Bard.
*46. “New Imaging Possibilities with Fast-Scan
Cyclic Voltammetry Scanning Electrochemical Microscopy,”David O. Wipf at the 3rd Workshop on Scanning Electrochemical
Microscopy,
*45. “New Imaging Possibilities with Fast-Scan Cyclic Voltammetry Scanning Electrochemical Microscopy,”David O. Wipf, M. Alpuche-Aviles (Mississippi State University), and L. Diaz-Ballote at the 205th Meeting of the Electrochemical Society, San Antonio, TX, May 9-14, 2004. (Invited)
*44. “Multi-Dimensional
Imaging in Scanning Electrochemical Microscopy,” David O. Wipf at
*43. “Fast-Scan Stripping Voltammetry Imaging With the Scanning Electrochemical Microscope,” David O. Wipf and Mario A. Alpuche Aviles, at The 226th ACS National Meeting, New York, NY, September 7-11, 2003.
*42. “Voltammetry
Simulations by Spreadsheets,” David O. Wipf, at The 226th ACS National
Meeting,
*40. “Fast-Scan Stripping Voltammetry Imaging with Scanning Electrochemical Microscopy,” David O. Wipf, Mario A. Alpuche Aviles, and Luis Díaz-Ballote at Journées d’Électrochimie 2003, Poitiers, France, June 3-6, 2003.
#*39. “Multidimensional Imaging in Scanning Electrochemical
Microscopy”, David O. Wipf, Université Claude Bernard,
#*38. “Multidimensional Methods in Scanning Electrochemical
Microscopy”, David O. Wipf, Université
de Paris VI, Jussieu,
*37. “Scanning
Electrochemical Microscopy Examination of the O2 Reduction on Cast Iron -
E.E.-D. El-Giar and David O. Wipf, at the 203rd Meeting of the Electrochemical
Society,
#*36. “Multidimensional Imaging with Scanning
Electrochemical Microscopy”, David O. Wipf,
#*35. “Multidimensional Scanning Electrochemical Microscopy”, David O. Wipf, Truman State University, Kirksville, MO, Sept. 27, 2002. (Invited)
*34. “Constant-Distance Scanning in SECM,” David O. Wipf, Mario A. Alpuche Aviles, and Emad El-Deen M. El-Giar at PittCon 2001, New Orleans, LA, March 4-9, 2001.
#*33. “Applications of Scanning Electrochemical Microscopy,” David O. Wipf, CINVESTAV Unidad Mérida, March 16, 1999, Mérida, Yucatan, Mexico. (Invited)
#*32.“Microscale Surface Chemistry with the Scanning Electrochemical Microscope,” David O. Wipf, at the XIV National Congress of the Mexican Electrochemical Society, August 24-28, 1999, Mérida, Yucatan, Mexico. (Invited)
#*31. “Measurement of Local Electron-Transfer Rates on Electrodes with SECM,” David O. Wipf and Robert C. Tenent at the 25th Annual Conference of the Federation of Analytical Chemistry and Spectroscopy Societies, October 11-15, 1998, Austin TX. (Invited)
#*30. “Micro-Scale Electrochemistry with the Scanning Electrochemical Microscope,” David O. Wipf, Auburn University, AL, May 15, 1998. (Invited)
#*29. “Heterogeneously Modified Carbon Fiber Ultramicroelectrodes,” D. Wipf, R. C. Tenent, F. Ge, and J. Baur at the 193th Meeting of the Electrochemical Society, May 5, 1998, San Diego CA. (Invited)
*28. Modified Carbon Fiber Ultramicroelectrodes,” D. O. Wipf, R. C. Tenent, F. Ge, at Mississippi EPSCoR Conference, January 22, 1998, Jackson, MS.
#*27. Investigation of Localized Corrosion with the Scanning Electrochemical Microscope,” J. W. Still and D. O. Wipf, at the 1st International Workshop on Scanning Electrochemical Microscopy, September 7, 1997, Freiburg, Germany (Invited)
*26. Formation and Imaging of Heterogeneously Modified Carbon Fiber Ultramicroelectrodes,” D. O. Wipf, R. C. Tenent, F. Ge, at Electrochem ‘97 August 29, 1997, London, England
#*25. Local Modification of Electrode Surfaces by the Scanning Electrochemical Microscope,” D. O. Wipf, University of South Dakota, November 18, 1996. (Invited)
#*24. Local Modification of Electrode Surfaces by the Scanning Electrochemical Microscope,” D. O. Wipf, University of Wisconsin - Eau Claire, November 15, 1996. (Invited)
#*23. Local Modification of Electrode Surfaces by the Scanning Electrochemical Microscope,” D. O. Wipf, University of Southern Mississippi, October 25, 1996. (Invited)
*22. Examination of Passive Layer Breakdown and Formation with the Scanning Electrochemical Microscope”, John W. Still and David O. Wipf at the 190th Meeting of the Electrochemical Society, Oct. 10, 1996, San Antonio, TX.
#*21. Local Modification and Imaging of Surfaces by the Scanning Electrochemical Microscope,” D. O. Wipf, Paper #8, Great Lakes Regional Meeting of the American Chemical Society, May 19-22, 1996, Normal, IL. (Invited)
#*20. Local Modification and Imaging of Surfaces by the Scanning Electrochemical Microscope,” D. O. Wipf, April 4, 1996, presented at the University of Alabama, Tuscaloosa. (Invited)
#*19. Local Modification and Imaging of Surfaces by the Scanning Electrochemical Microscope,” D. O. Wipf, March 8, 1996 presented at Illinois State University, Normal, IL. (Invited)
*18. Initiation of Localized Corrosion on Iron with the Scanning Electrochemical Microscope,” David O. Wipf and John W. Still, Paper #746, Pittsburgh Conference and Exposition, March 6, 1996, Chicago, IL.
*17. Generation and Imaging of Derivatized Regions on Carbon Electrodes by the Scanning Electrochemical Microscope,” David O. Wipf, Robert C. Tenent, and Louis H. Bluhm+, Paper #745, Pittsburgh Conference and Exposition, March 6, 1996, Chicago, IL.
*16. Analytical Applications of Paired Carbon-Fiber Electrodes,” John E. Baur and David O. Wipf, Paper #097, Pittsburgh Conference and Exposition, March 6, 1996, Chicago, IL.
*15.
Initiation of Pitting Corrosion on Iron with
the Scanning Electrochemical Microscope,” David O. Wipf and John W. Still,
*14. Ohmic Potential-Drop Compensation by Iterative Correction of the Applied Potential,” D. O. Wipf, 47th Southeast / 51st Southwest Joint Regional Meeting of the American Chemical Society, Nov. 29-Dec. 1, 1995 Memphis, TN, No. 83.
#*13. Scanning Electrochemical Microscopy”, D. O. Wipf, Oct. 6, 1995 presented at Tennessee Technological University, Cookeville TN. (Invited)
*12. Activation of Carbon Electrodes by UV/Ozone Treatment,” D. O. Wipf and J. Zhou, Paper #256, 187th Electrochemical Society Meeting, May 21-26, 1995, Reno NV.
#*11. Formation and Study of Localized Corrosion by Scanning Electrochemical Microscopy,” David O. Wipf, April 20, 1995, presented at Florida State University, Tallahassee FL. (Invited)
#*10. Initiation and Study of Localized Corrosion with the Scanning Electrochemical Microscope,” David O. Wipf, October 21, 1994, presented at Jackson State University, Jackson MS. (Invited)
*9. Examination of Pitting Corrosion with Scanning Electrochemical Microscopy,” David O. Wipf, presented at 1994 SEAAC (Southeast Academic Analytical Chemistry) Meeting, Florida State University, Tallahassee FL, September 23-24, 1994.
#*8. Formation and Study of Pitting Corrosion by Scanning Electrochemical Microscopy,” David O. Wipf, Paper #202, presented at the 208th American Chemical Society National Meeting and Exposition, Washington DC, August 21-25, 1994. (Invited)
#*7. Scanning
Electrochemical Microscopy” David O. Wipf, presented at the University of
Mississippi, Oxford, MS, January 21, 1994. (Invited)
#*6. Initiation and Study of Localized Corrosion by Scanning Electrochemical Microscopy,” David O. Wipf, Surface Characterization of Adsorption and Interfacial Reactions, Engineering Foundation Conference, January 9-14, 1994, Kona, HI. (Invited)
5. Constant-Current Imaging with the Scanning Electrochemical Microscope,” David O. Wipf and Allen J. Bard, Paper #811, Pittsburgh Conference and Exposition, March 10, 1993, Atlanta, GA.
4. Tip-Modulated Scanning Electrochemical Microscopy,” David O. Wipf and Allen J. Bard, Paper #944, Pittsburgh Conference and Exposition, March 11, 1992.
#3. Scanning Electrochemical Microscopy for Characterization of Electrochemical and Chemical Processes at Surfaces,” David O. Wipf, Guy Denuault, and Allen J. Bard, presented at the SE/SW Combined Regional Meeting of the ACS , December 6, 1990. (Invited)
2. Measurement of Heterogeneous and Homogeneous Rate Constants with Fast-Scan Cyclic Voltammetry,” David O. Wipf and R. Mark Wightman, presented at the International Electroanalytical Symposium, May 28, 1987.
1. Measurement of Heterogeneous and Homogeneous Rate Constants with Fast-Scan Cyclic Voltammetry,” David O. Wipf and R. Mark Wightman, presented at the Pittsburgh Conference and Exposition, March 9, 1987.
*40. “Evaluation of VGCNF/Paint-Coated Mild Steel Using Electrochemical Impedance Spectroscopy (EIS) in 3% NaCl Solution,” Sahar M. Atwa and David O. Wipf, 2004 Southeast Regional Meeting of the ACS, Research Triangle Park, NC, November 10-13, 2004.
*39. “Visualization of the Electrochemical Activity of Silicon Carbide Particles in Aluminum Composites by Scanning Electrochemical Microscopy,” L. Díaz-Ballote, David O. Wipf, M. Pech Canul, and L. Veleva, XIII International Materials Research Congress, Cancún Mexico August 22-26, 2004,
#*38. “Imaging Model Neurons With the Scanning Electrochemical Microscope,” John E. Baur, Ruwan Kurulugama, Paul A. Garris, and David O. Wipf, at The 226th ACS National Meeting, New York, NY, September 7-11, 2003.
*37. Stripping Voltammetry Imaging With Scanning
Electrochemical Microscopy - M. Alpuche-Aviles David
O. Wipf, at the 203rd Meeting of the Electrochemical Society, Paris, France,
April 27-May 2, 2003.
*36. Electrochemical Study and Surface Analysis of Passive Films on AISI 316 Stainless Steel Grown in Alkaline Solutions,” Lucien Veleva, Mario A. Alpuche-Aviles, Melissa K. Graves-Brook, and David O. Wipf at the 15th International Corrosion Congress, Granada, Spain, September 22-27, 2002.
*35. Electrochemical Detection for Microchip Separation Devices,” Charles S. Henry, Yan Liu, Joseph C. Fanguy, David O. Wipf at the 201st Meeting of The Electrochemical Society in Philadelphia, PA, May 12-17, 2002.
*34. Constant-Separation Imaging of Live Mammalian Cells with the Scanning Electrochemical Microscope Using Carbon Ring Probes,” John E. Baur and David O. Wipf at PittCon 2002, New Orleans, LA, March 17-22, 2002.
*33. Improving Impedance Feedback Control in Scanning Electrochemical Microscopy,” Mario A. Alpuche Aviles and David O. Wipf at PittCon 2002, New Orleans, LA, March 17-22, 2002.
*32. Scanning Electrochemical Microscopy Imaging with pH Sensitive Iridium Oxide Microelectrodes,” Emad El-Deen M. El-Giar and David O. Wipf at PittCon 2002, New Orleans, LA, March 17-22, 2002.
*31. Fast Scan Cyclic Voltammetry-Scanning Electrochemical Microscopy,” Luis Díaz-Ballote and David O. Wipf at PittCon 2002, New Orleans, LA, March 17-22, 2002.
*29. Conductivity Detection for Microchip Capillary Electrophoresis,” Charles S. Henry, David O. Wipf, Jamie Vollenweider, at SmallTalk2001, San Diego, CA, Aug. 29-31, 2001.
*28. An Impedance Feedback Method for Examination of Corrosion with SECM,” Mario A. Alpuche Aviles and David O. Wipf at PittCon 2001, New Orleans, LA, March 4-9, 2001.
*27. A Microparticle Iridium Oxide pH Ultramicroelectrode for SECM,” Emad El-Deen M. El-Giar and David O. Wipf at PittCon 2000, New Orleans, LA, March 4-9, 2001.
26. Characterization of a Conductivity Detector for Microchip Capillary Electrophoresis,” Yan Liu, David O. Wipf, and Charles S. Henry at the 52nd Southeast / 56th Southwest Joint Regional Meeting of the American Chemical Society, New Orleans, LA, Dec. 6-8, 2000.
*25. In-Channel Conductivity Detection for Microchip Capillary Electrophoresis,” Jasper R. Clarkson+, Charles S. Henry, and David O. Wipf at the 52nd Southeast / 56th Southwest Joint Regional Meeting of the American Chemical Society, New Orleans, LA, Dec. 6-8, 2000.
*24. Shear Force Distance Regulation for Scanning Electrochemical Microscopy,” Mario A. Alpuche Aviles and David O. Wipf at PittCon 2000, New Orleans, LA, March 12-17, 2000.
*23. A New Procedure for Construction of Small Carbon-Fiber Electrodes,” Emad El-Deen M. El-Giar and David O. Wipf at PittCon 2000, New Orleans, LA, March 12-17, 2000.
*22. Direct Observation and Kinetic Measurements of Active Sites on Glassy Carbon Electrodes”, Robert C. Tenent and David O. Wipf at PittCon ’99, Orlando, FL, March 7-12, 1999.
*21. Direct Observation and Kinetic Measurements of Active Sites on Glassy Carbon Electrodes,” Robert C. Tenent and David O. Wipf Mississippi EPSCoR Conference, Jackson, MS, March 2-3, 1999.
*20. Metal-Metal Bonding in M2(form)4 Complexes,” Kathryn M. Carlson-Day, Judith L. Eglin, Laura T. Smith, Richard J. Staples, and David O. Wipf, Mississippi EPSCoR Conference, Jackson, MS, March 2-3, 1999.
*19. Studies of Heterogeneously Modified Carbon Electrodes by Scanning Electrochemical Microscopy,” Robert C. Tenent and David O. Wipf at PittCon ’98, March 1-5, 1998, New Orleans, LA
*18. Localized Passive Layer and Corrosion Studies of Various Aluminum Alloys Using the Scanning Electrochemical Microscope”, John Still and and David O. Wipf at PittCon ’98, March 1-5, 1998, New Orleans, LA
17. Localized Avidin/Biotin Derivatization of Glassy Carbon Electrodes Using Scanning Electrochemical Microscopy”, Wilbur B. Nowall, David O. Wipf, and Werner G. Kuhr at the Electrochemistry Gordon Conference, January 18-23 1998, Ventura CA
*16. Use of
Formamidine Ligands in the Synthesis of Quadruply Bonded Dichromium Complexes”,
Kathryn M. Carlson-Day, Judith L. Eglin, Laura T. Smith, Richard J. Staples, and David O.
Wipf, Mississippi EPSCoR Conference, January 21- 22, 1998, Jackson, MS
15. Synthesis
of Dichromium Formamidinate Complexes” Kathryn M. Carlson-Day, Judith L. Eglin, Laura
T. Smith, Richard J. Staples, and David O. Wipf, 214th National Meeting of the ACS,
September 11 - 15, 1997, Las Vegas, Nevada.
*14. A Method for the Heterogeneous Derivatization of Carbon-Fiber Ultramicroelectrodes”, Robert C. Tenent and David O. Wipf at PittCon ’97, March 16-21, 1997, Atlanta, GA
*13. Localized Corrosion Studies of Iron using the Scanning Electrochemical Microscope,” John W. Still, David O. Wipf, Mississippi EPSCoR Conference, Jan. 29, 1997, Jackson, MS, No. 9.
*#12. Development of a Scanning Electrochemical Microscope for the Surface Modification of Carbon Fiber Electrodes,” W. B. Nowall, S. E. Rosenwaldt, W. G. Kuhr, R. Tenent and D. O. Wipf, Microfabricated Sensors, Instruments and Systems for Biological and Medical Applications, May 6-8, 1996, University of California, Davis.
*11. UV/Ozone Pretreatment of Carbon Electrodes,” Junfeng Zhou and David O. Wipf, Paper #112P, Pittsburgh Conference and Exposition, March 6, 1996, Chicago, IL.
*10. Patterning and Imaging of Conducting Polyaniline with the Scanning Electrochemical Microscope,” David O. Wipf and Junfeng Zhou, Mississippi EPSCoR Conference, Jan. 31, 1996, Jackson, MS, No. 21.
*9. Surface Modification and Characterization of Carbon Electrodes,” L. H. Bluhm+ and D. O. Wipf, 47th Southeast / 51st Southwest Joint Regional Meeting of the American Chemical Society, Nov. 29-Dec. 1, 1995 Memphis, TN, No. 240
*8. Generation and Imaging of Locally Oxidized Regions on Carbon Electrodes by Scanning Electrochemical Microscopy,” R. C. Tenent and D. O. Wipf, 47th Southeast / 51st Southwest Joint Regional Meeting of the American Chemical Society, Nov. 29-Dec. 1, 1995 Memphis, TN, No. 20
*7. Study of Pitting Corrosion Using Iron in Aqueous Trichloroacetic Acid,” J. W. Still and D. O. Wipf, 47th Southeast / 51st Southwest Joint Regional Meeting of the American Chemical Society, Nov. 29-Dec. 1, 1995 Memphis, TN, No. 82
*6. UV/Ozone Treatment to Activate Carbon Electrodes,” J. Zhou and D. O. Wipf, 47th Southeast / 51st Southwest Joint Regional Meeting of the American Chemical Society, Nov. 29-Dec. 1, 1995 Memphis, TN, No. 84
*5. Chemical Activation of Carbon Electrodes,” L. H. Bluhm+ and David O. Wipf, presented at the 27th Annual Southeast Regional American Chemical Society Conference of Undergraduate Student Chemists, Clemson, SC, March 16-17, 1995
*4. Examination of Pitting by Scanning
Electrochemical Microscopy,” Jeannette C. Polkinghorne+, John W. Still, and David O. Wipf, presented at the 209th
Meeting of the American Chemical Society,
*3. Examination of Pitting by Scanning
Electrochemical Microscopy,” Jeannette C. Polkinghorne+, John W. Still, and David O. Wipf, presented at the 47th
Southeast Regional Meeting of the American Chemical Society,
*2. Electrochemical Investigation of the Reduction of Trichloroacetic Acid in Aqueous Solution,” David O. Wipf, John Still, at the Advances in Modern Nuclear Magnetic Resonance Techniques, June 9-11, 1994 Mississippi State University, John Still, presenter.
*1. Chemical Oxidation of Glassy-Carbon Electrodes,” David O. Wipf, Jiwen Chen, at the Advances in Modern Nuclear Magnetic Resonance Techniques, June 9-11, 1994 Mississippi State University, Jiwen Chen, presenter.
“Electrode Modification by UV/Ozone Treatment and Scanning Electrochemical Microscope Polyaniline Deposition,” Junfeng Zhou, M. S. Thesis, Mississippi State University, 1997.
“A Study of Localized Corrosion by Scanning Electrochemical
Microscope,” John W. Still, Ph.D. Dissertation, Mississippi State University, 1999.
“Localized Modification and Studies of Carbon Electrode
Surfaces by Scanning Electrochemical Microscopy,” Robert C.
Tenent, Ph.D. Dissertation, Mississippi State University, 2000.
“Preparation and Scanning Electrochemical Microscopy (SECM)
Applications of Carbon Fiber and Metal Particle Ultramicroelectrodes (UMEs),” Emad
El-Deem Mohamed El-Giar, Ph.D. Dissertation, Mississippi State University, 2004.
“Development of Multidimensional Methods for Scanning
Electrochemical Microscopy (SECM),” Mario Alberto Alpuche Avilés, Ph.D.
Dissertation, Mississippi State University, 2005.
* Resulting from research at Mississippi State University
# Invited Presentation.
+
Undergraduate student.